Systematic errors for a Mueller matrix dual rotating compensator ellipsometer
نویسندگان
چکیده
منابع مشابه
Multichannel Mueller matrix ellipsometer based on the dual rotating compensator principle
A multichannel ellipsometer in the dual rotating-compensator configuration has been designed and constructed for applications in real time Mueller matrix ellipsometry (approx. 2–5 eV) of anisotropic surfaces and films. The sequence of optical elements for this instrument is denoted PC (v )SC (v )A, where P, S, and A represent the polarizer, sample, and analyzer. C (v ) and 1r 1 2r 2 1r 1 C (v )...
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ژورنال
عنوان ژورنال: Optics Express
سال: 2008
ISSN: 1094-4087
DOI: 10.1364/oe.16.008814